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LED and Luminaire Failure Analysis

Although intended for thousands of hours of operation, LEDs do not always live up to expectation.

 Patchiness in light emission created by a dislocated GaN substrate.

Typical applications:



Patchiness in light emission created by a disloacted GaN substrate.


MuAnalysis offers a wide range of sophisticated analytical techniques for examining materials and devices, including: 

Inside an A-19 light bulb

Acoustic Microscopy

X-Ray Imaging

Electron Microscopy with EDX  

X-Ray Fluorescence Spectroscopy

Raman Micro-Spectroscopy

FTIR Micro-Spectroscopy

UV Fluorescence Microscopy

Confocal Laser Scanning Microscopy

Environmental Chamber Stressing

and more…

 Inside an A-19 light bulb

Technical Description:

Troubled by  a semiconductor device issue, a packaging issue, or an assembly issue? Bring your problem to MuAnalysis to resolve.

Side-view of surface-mount LED

 Side-view of surface-mount LED 












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