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X-Ray Fluorescence (XRF)

X-Ray Fluorescence spectroscopy (XRF) enables rapid identification of the elements that comprise a sample. Chemical bonding information is not revealed; hence the technique applies mostly to metals and plating analysis. XRF is particularly useful to detect lead or lead residue in devices that are alleged to be lead-free. Since vacuum is not required, large samples can be readily analyzed. Plating thickness can be verified rapidly and non-destructively, without the need for cross-section.

Detection of residual Sn/Pb (pink and yellow traces) in samples alleged to be lead-free.
Detection of residual Sn/Pb (pink and yellow traces) in samples alleged to be lead-free.

Typical applications

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