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Dynamic Electroluminescence Imaging (DEI)
Emission Microscopy (EMMI)
Energy Dispersive X-Ray (EDX)
Fourier Transform Infrared (FTIR) Spectroscopy
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Optical Beam Induced Current (OBIC)
Optical Microscopy
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Confocal Scanning Acoustic Microscopy (CSAM)
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Decapsulation and Repacking of ICs
Disjointment and RoHS Screening Analysis
Dynamic Electroluminescence Imaging (DEI)
Electrical Testing
Emission Microscopy (EMMI)
Energy Dispersive X-ray (EDX)
Environmental Testing
ESD & Latchup Testing
Fourier Transform Infrared (FTIR) Spectroscopy
Laser Scanning Microscopy (LSM)
Lead-Free Analysis
Liquid Crystal and Fluorescent Microthermal Imaging (FMI)
MuAnalysis Joint Integrity Characterization (MAJIC)
Optical Beam Induced Current (OBIC)
Optical Microscopy
Process, Package and Product Qualification
Raman Spectroscopy
Sample Preparation Delayering and Cross-sectioning for FA
Scanning Electron Microscopy (SEM)
Solderability Testing
Temperature Cycling & Temperature Shock
X-Ray Fluorescence (XRF)
X-Ray Imaging
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Publications
Teardown Reports
Below are summaries of the complete teardown reports which are available for purchase.
MuAnalysis Teardown reports price list May 2013
LED Inside View Reports
A19 LED bulbs teardown Feit, GE, Pharox, Philips, Sylvania
Cree CGH40010 GaN HEMT
Cree XLAMP LED Lamp
EPC GaN MOSFET
Infineon (G1 and G2) vs. Cree 6 Amp and ST Microelectronics 10 Amp SiC Schottky Diodes
Lumileds Luxeon K2 LED Lamp
Lumileds Luxeon Rebel LED Lamp
Nichia Jupiter LED
Nitronex NPT35015 GaN HEMT
Nitronex NPTB0004 GaN HEMT Teardown Report
Osram Dragon LED Lamp
Seoul Semiconductor Z-Power LED P9 Series
Papers and Presentations
Detecting Counterfeit Electronic Components
Read our article
The Anatomy of the LED light bulb, appearing in the May 23 2102 issue of EETimes.
Counterfeit or Retrofit
Printed Circuit Board Reliability and Integrity Characterization Using MAJIC
Quantum Wells in the Seasonal Department, the Technology of LED Christmas Lights
We present a
teardown
and technology analysis of the widely available multi-coloured LEDs sold as Christmas lights. In this report, interesting findings are documented and demonstrations of some advanced analysis techniques are illustrated.
Dynamic Electroluminescence Imaging (DEI) applied to an OTP EPROM memory device
Dynamic Electroluminescence Imaging as an "Optical Oscilloscope" Probe
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